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Optical nano surface profilometer

This system uses white light interferometry technology to obtain topographic image from surfaces. The data recorded using a high speed/accuracy 3D moving stage is analyzed by standard software such as “Gwyddion”. This system can offer an accuracy of 5nm with a scan window size of 1mm×1.2mm and 10mm height displacement as well as high speed scan rate and is suitable for soft and hard samples in various size and shapes. The stage is also can be customize to a mosaic like extra-large window size (centimeter scale) based on customer request.

The instrument is ready to sell and/or give services. We can also provide sample test before you buy.

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